Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG. It enables the precise preparation and analysis of a wide range of applications for our customers.
The Tescan Amber X is a unique combination of field-free, ultra-high resolution BrightBeam™ SEM optics and Xenon Plasma FIB, which allows for the precise preparation and analysis of various applications. Are you already aware of its benefits?

- High throughput and large area FIB processing

- Ultra-high resolution, field-free FEG-SEM imaging and analysis

- High-resolution mass spectrometer

- Rocking stage for improved polishing quality

- Superior field of view for easy navigation

- Easy-to-use, modular graphical user interface

An EDX detector with an extra-large detection window for the depiction of the specific composition of a surface completes the system.