{"id":13128,"date":"2022-08-19T14:06:00","date_gmt":"2022-08-19T12:06:00","guid":{"rendered":"https:\/\/recursing-brattain.37-120-171-104.plesk.page\/fib-sem\/"},"modified":"2024-05-24T14:25:32","modified_gmt":"2024-05-24T12:25:32","slug":"fib-sem","status":"publish","type":"post","link":"https:\/\/iwgplating.com\/en\/fib-sem\/","title":{"rendered":"The new FIB-SEM electron microscope Tescan Amber X"},"content":{"rendered":"<section class=\"ls-newsdetail-test\"><div class=\"ls-newsdetail_header\"><div class=\"ls-newsdetail_header__metadata\"><p class=\"ls-newsdetail_header__date\">August 2022 | <\/p><p class=\"ls-newsdetail-header__category\">Lab Solutions <\/p><\/div><h1 class=\"ls-newsdetail_header__headline mb-12\">The new FIB-SEM electron microscope Tescan Amber X<\/h1><div class=\"ls-newsdetail_header__heading\"><div class=\"ls-newsdetail_header__image\"><img decoding=\"async\" width=\"1024\" height=\"768\" src=\"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp\" class=\"attachment-full size-full wp-post-image\" alt=\"\" srcset=\"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp 1024w, https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-600x450.webp 600w, https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-300x225.webp 300w, https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-768x576.webp 768w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/div><div class=\"ls-newsdetail__icons\"><\/div><\/div><\/div><div class=\"ls-newsdetail_main\"><div class=\"ls-newsdetail_content\">\n<p>Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG. It enables the precise preparation and analysis of a wide range of applications for our customers.<br>The Tescan Amber X is a unique combination of field-free, ultra-high resolution BrightBeam\u2122 SEM optics and Xenon Plasma FIB, which allows for the precise preparation and analysis of various applications. Are you already aware of its benefits?<\/p>\n\n\n\n<p>&#8211; High throughput and large area FIB processing<\/p>\n\n\n\n<p>&#8211; Ultra-high resolution, field-free FEG-SEM imaging and analysis <\/p>\n\n\n\n<p>&#8211; High-resolution mass spectrometer<\/p>\n\n\n\n<p>&#8211; Rocking stage for improved polishing quality<\/p>\n\n\n\n<p>&#8211; Superior field of view for easy navigation<\/p>\n\n\n\n<p>&#8211; Easy-to-use, modular graphical user interface<\/p>\n\n\n\n<p>An EDX detector with an extra-large detection window for the depiction of the specific composition of a surface completes the system.<\/p>\n\n\n\n<div style=\"height:100px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<figure class=\"wp-block-embed is-type-video is-provider-youtube wp-block-embed-youtube wp-embed-aspect-16-9 wp-has-aspect-ratio\"><div class=\"wp-block-embed__wrapper\">\n <div class=\"brlbs-cmpnt-container brlbs-cmpnt-content-blocker brlbs-cmpnt-with-individual-styles\" data-borlabs-cookie-content-blocker-id=\"youtube-content-blocker\" data-borlabs-cookie-content=\"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\"><div class=\"brlbs-cmpnt-cb-preset-c brlbs-cmpnt-cb-youtube\"> <div class=\"brlbs-cmpnt-cb-thumbnail\" style=\"background-image: url('https:\/\/iwgplating.com\/app\/uploads\/borlabs-cookie\/1\/yt_QYeXD4mLugo_hqdefault.jpg')\"><\/div> <div class=\"brlbs-cmpnt-cb-main\"> <div class=\"brlbs-cmpnt-cb-play-button\"><\/div> <div class=\"brlbs-cmpnt-cb-content\"> <p class=\"brlbs-cmpnt-cb-description\">You are currently viewing a placeholder content from <strong>YouTube<\/strong>. To access the actual content, click the button below. 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W. Garh\u00f6fer Ges.m.b.H.\",\"alternateName\":\"IWG\",\"url\":\"https:\/\/iwgplating.com\/en\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/iwgplating.com\/en\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/iwgplating.com\/app\/uploads\/2025\/03\/IWG-Logo-2021.jpg\",\"contentUrl\":\"https:\/\/iwgplating.com\/app\/uploads\/2025\/03\/IWG-Logo-2021.jpg\",\"width\":1182,\"height\":1182,\"caption\":\"IWG Ing. W. Garh\u00f6fer Ges.m.b.H.\"},\"image\":{\"@id\":\"https:\/\/iwgplating.com\/en\/#\/schema\/logo\/image\/\"},\"sameAs\":[\"https:\/\/www.facebook.com\/profile.php?id=61580281291673\",\"https:\/\/www.linkedin.com\/company\/iwg-plating\/\",\"https:\/\/www.youtube.com\/channel\/UCBckf7OxfbEoTy0cVT0I22Q\"],\"email\":\"office@iwgplating.com\",\"telephone\":\"+43 228771073-0\",\"legalName\":\"IWG Ing. W. Garh\u00f6fer Ges.m.b.H.\",\"foundingDate\":\"1960-01-01\",\"numberOfEmployees\":{\"@type\":\"QuantitativeValue\",\"minValue\":\"11\",\"maxValue\":\"50\"}},{\"@type\":\"Person\",\"@id\":\"https:\/\/iwgplating.com\/en\/#\/schema\/person\/9687330a7a2d833b577733e10d5232a6\",\"name\":\"Julia Dollinger\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/iwgplating.com\/en\/#\/schema\/person\/image\/\",\"url\":\"https:\/\/secure.gravatar.com\/avatar\/10c32fe423679b97f725fb559ce160c4b683e7bc49b93ea089e1a63824ed21c7?s=96&d=mm&r=g\",\"contentUrl\":\"https:\/\/secure.gravatar.com\/avatar\/10c32fe423679b97f725fb559ce160c4b683e7bc49b93ea089e1a63824ed21c7?s=96&d=mm&r=g\",\"caption\":\"Julia Dollinger\"}}]}<\/script>\n<!-- \/ Yoast SEO Premium plugin. -->","yoast_head_json":{"title":"FIB-SEM Scanning Electron Microscope - New! IWG Plating","description":"Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG Plating.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/iwgplating.com\/en\/fib-sem\/","og_locale":"en_US","og_type":"article","og_title":"The new FIB-SEM electron microscope Tescan Amber X","og_description":"Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG Plating.","og_url":"https:\/\/iwgplating.com\/en\/fib-sem\/","og_site_name":"IWG Plating","article_publisher":"https:\/\/www.facebook.com\/profile.php?id=61580281291673","article_published_time":"2022-08-19T12:06:00+00:00","article_modified_time":"2024-05-24T12:25:32+00:00","og_image":[{"width":1024,"height":768,"url":"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp","type":"image\/webp"}],"author":"Julia Dollinger","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Julia Dollinger","Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#article","isPartOf":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/"},"author":{"name":"Julia Dollinger","@id":"https:\/\/iwgplating.com\/en\/#\/schema\/person\/9687330a7a2d833b577733e10d5232a6"},"headline":"The new FIB-SEM electron microscope Tescan Amber X","datePublished":"2022-08-19T12:06:00+00:00","dateModified":"2024-05-24T12:25:32+00:00","mainEntityOfPage":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/"},"wordCount":144,"publisher":{"@id":"https:\/\/iwgplating.com\/en\/#organization"},"image":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#primaryimage"},"thumbnailUrl":"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp","articleSection":["Lab Solutions"],"inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/iwgplating.com\/en\/fib-sem\/","url":"https:\/\/iwgplating.com\/en\/fib-sem\/","name":"FIB-SEM Scanning Electron Microscope - New! IWG Plating","isPartOf":{"@id":"https:\/\/iwgplating.com\/en\/#website"},"primaryImageOfPage":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#primaryimage"},"image":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#primaryimage"},"thumbnailUrl":"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp","datePublished":"2022-08-19T12:06:00+00:00","dateModified":"2024-05-24T12:25:32+00:00","description":"Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG Plating.","breadcrumb":{"@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/iwgplating.com\/en\/fib-sem\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#primaryimage","url":"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp","contentUrl":"https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp","width":1024,"height":768},{"@type":"BreadcrumbList","@id":"https:\/\/iwgplating.com\/en\/fib-sem\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/iwgplating.com\/en\/"},{"@type":"ListItem","position":2,"name":"The new FIB-SEM electron microscope Tescan Amber X"}]},{"@type":"WebSite","@id":"https:\/\/iwgplating.com\/en\/#website","url":"https:\/\/iwgplating.com\/en\/","name":"IWG Plating","description":"","publisher":{"@id":"https:\/\/iwgplating.com\/en\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/iwgplating.com\/en\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/iwgplating.com\/en\/#organization","name":"IWG Ing. W. Garh\u00f6fer Ges.m.b.H.","alternateName":"IWG","url":"https:\/\/iwgplating.com\/en\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/iwgplating.com\/en\/#\/schema\/logo\/image\/","url":"https:\/\/iwgplating.com\/app\/uploads\/2025\/03\/IWG-Logo-2021.jpg","contentUrl":"https:\/\/iwgplating.com\/app\/uploads\/2025\/03\/IWG-Logo-2021.jpg","width":1182,"height":1182,"caption":"IWG Ing. W. Garh\u00f6fer Ges.m.b.H."},"image":{"@id":"https:\/\/iwgplating.com\/en\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/www.facebook.com\/profile.php?id=61580281291673","https:\/\/www.linkedin.com\/company\/iwg-plating\/","https:\/\/www.youtube.com\/channel\/UCBckf7OxfbEoTy0cVT0I22Q"],"email":"office@iwgplating.com","telephone":"+43 228771073-0","legalName":"IWG Ing. W. Garh\u00f6fer Ges.m.b.H.","foundingDate":"1960-01-01","numberOfEmployees":{"@type":"QuantitativeValue","minValue":"11","maxValue":"50"}},{"@type":"Person","@id":"https:\/\/iwgplating.com\/en\/#\/schema\/person\/9687330a7a2d833b577733e10d5232a6","name":"Julia Dollinger","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/iwgplating.com\/en\/#\/schema\/person\/image\/","url":"https:\/\/secure.gravatar.com\/avatar\/10c32fe423679b97f725fb559ce160c4b683e7bc49b93ea089e1a63824ed21c7?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/10c32fe423679b97f725fb559ce160c4b683e7bc49b93ea089e1a63824ed21c7?s=96&d=mm&r=g","caption":"Julia Dollinger"}}]}},"uagb_featured_image_src":{"full":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",1024,768,false],"thumbnail":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-150x150.webp",150,150,true],"medium":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-300x225.webp",300,225,true],"medium_large":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-768x576.webp",768,576,true],"large":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",1024,768,false],"1536x1536":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",1024,768,false],"2048x2048":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",1024,768,false],"product-single-page-picture-size":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",1024,768,false],"gform-image-choice-sm":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",300,225,false],"gform-image-choice-md":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",400,300,false],"gform-image-choice-lg":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM.webp",600,450,false],"woocommerce_thumbnail":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-300x300.webp",300,300,true],"woocommerce_single":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-600x450.webp",600,450,true],"woocommerce_gallery_thumbnail":["https:\/\/iwgplating.com\/app\/uploads\/2022\/08\/FIB-SEM-100x100.webp",100,100,true]},"uagb_author_info":{"display_name":"Julia Dollinger","author_link":"https:\/\/iwgplating.com\/en\/author\/j-dollinger\/"},"uagb_comment_info":0,"uagb_excerpt":"Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG.","_links":{"self":[{"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/posts\/13128","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/comments?post=13128"}],"version-history":[{"count":0,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/posts\/13128\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/media\/10560"}],"wp:attachment":[{"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/media?parent=13128"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/categories?post=13128"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/iwgplating.com\/en\/wp-json\/wp\/v2\/tags?post=13128"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}